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Originally Posted by randytsuch
I figured the output transistors, since they must act in concert with each other, would have a bigger effect if they are not matched, so I would like to match them as close as possible.
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Originally Posted by randytsuch
I figured the output transistors, since they must act in concert with each other, would have a bigger effect if they are not matched, so I would like to match them as close as possible.
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Originally Posted by amb
Actually, the output transistors have the benefit of global negative feedback to compensate for mismatchings. The input differential stages, and their constant current source transistors, on the other hand, are much more sensitive to mismatches because they are the very devices responsible for making global negative feedback work.
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Originally Posted by randytsuch
I was also wondering if I could test these other transistors, which are already installed on the board. If I apply a small positive dc voltage to the input (of course nothing will be connected to the output), and measure the outputs from the front end transistors. Then, I could reverse the input leads to apply a negative input voltage, and measure again.
Is this reasonable? Randy |
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Originally Posted by chillysalsa
I couldn't get some of them down to 1 mA, so some measurements were done at 1.5 - 2.5 mA. Even 2.5M ohms wasn't enough in the Rb value to get the collector current down. I'll just assume matching within the same range is better than no matching at all... it at least let me catch one of the 2SC3381BL that was a dud.
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Originally Posted by chillysalsa
hFE = (mA METER) / (Irb)
where Irb = VRb / Rb while Rb is measured with the power off. |
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Originally Posted by Pars
I constructed a circuit similar to what was posted. Since I did not have any suitable pots (nor did ratshack), I decided to use a fixed resistor of 220K, giving an Ic value of 10-11mA on the PNPs (2SA1015). Since I know the resistance up front from measuring it, and powering it with 9V from a bench supply, I can more or less assume that when testing in one batch (i.e., one sitting without powering the supply down) that the base current (Ib) will be constant. I will still measure Vb and compute the base current each time unless I see that Vb is holding steady (it seems to be). I will obviously measure Ic for each device and compute the hFE from the measurements.
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Originally Posted by amb
The input differential stages, and their constant current source transistors, on the other hand, are much more sensitive to mismatches because they are the very devices responsible for making global negative feedback work.
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Putting together those quotes above, I understand the critical matching seems to go for 1145 and 2705 (input differential stages? Or do the 1349 and 3381's also belong there?). So in any case, how about the following ultra-cheapo-simple transistor matching procedure:

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Originally Posted by Pars
Since I didn't know the exact Ic for each position in a dynalo, I just used ~10mA as a close enough guess
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Originally Posted by amb
My calculations of the collector currents of the BJTs in the dynalo are: 2mA each for the CCS transistors, 4.3mA for the VAS stage, and about 18mA for each of the output transistors.
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, but the other has about 90mv of offset
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Originally Posted by randytsuch
So, I have assembled both boards now, and tested them.
Without the pots or opamps, one has 14 mv of offset , but the other has about 90mv of offset .Now, I need to look at the second one, and see what is causing that big offset. Randy |
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Originally Posted by dgardner
Looks like MCM is out of stock on the Toshiba 2SC3425. Does anyone have another distributor to recommend? Been matching and baggin transistors all day. I want some more parts for tighter matches.
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